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1 ATPG pattern
тестовый набор кодов (набор тестовых кодов), полученный при помощи генератора ATPGАнгло-русский толковый словарь терминов и сокращений по ВТ, Интернету и программированию. > ATPG pattern
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2 ATPG
1) Automatic Test Pattern Generator - автоматический генератор тестовых наборов2) Automatic Test Pattern Generation - автоматическая генерация тестовых наборовсм. тж. pattern generationАнгло-русский толковый словарь терминов и сокращений по ВТ, Интернету и программированию. > ATPG
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3 ATPG
1) Военный термин: automatic test program generation3) Сокращение: Automatic Test-Pattern Generation -
4 ATPG
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5 ATPG
сокр. от automatic test pattern generationавтоматическая генерация тестовых кодов -
6 ATPG
1. automatic test pattern generation - автоматическая генерация тестовых кодовых сочетаний сигналов; автоматическая генерация тестовых кодов;2. automatic test program generator - автоматический генератор тестовых программ -
7 ATPG
сокр. от automatic test-pattern generationEnglish-Russian dictionary of telecommunications and their abbreviations > ATPG
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8 test-pattern generator
Англо-русский толковый словарь терминов и сокращений по ВТ, Интернету и программированию. > test-pattern generator
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9 BIST pattern
Англо-русский толковый словарь терминов и сокращений по ВТ, Интернету и программированию. > BIST pattern
См. также в других словарях:
ATPG — Automatic Test Pattern Generation (Academic & Science » Electronics) … Abbreviations dictionary
ATPG — Automatic Test Pattern Generation … Acronyms
ATPG — Automatic Test Pattern Generation … Acronyms von A bis Z
Automatic test pattern generation — ATPG (acronym for both Automatic Test Pattern Generation and Automatic Test Pattern Generator) is an electronic design automation method/technology used to find an input (or test) sequence that, when applied to a digital circuit, enables testers… … Wikipedia
GATTO — is a genetic algorithm for automatic test pattern generation (ATPG) for testing of VLSI circuits. See also *ATPG *VLSI *Genetic Algorithms *Programming … Wikipedia
Stuck-at fault — A Stuck at fault is a particular fault model used by fault simulators and Automatic test pattern generation (ATPG) tools to mimic a manufacturing defect within an integrated circuit. Individual signals and pins are assumed to be stuck at Logical… … Wikipedia
Electronic design automation — (EDA) is the category of tools for designing and producing electronic systems ranging from printed circuit boards (PCBs) to integrated circuits. This is sometimes referred to as ECAD (electronic computer aided design) or just CAD. (Printed… … Wikipedia
Design For Test — (aka Design for Testability or DFT ) is a name for design techniques that add certain testability features to a microelectronic hardware product design. The premise of the added features is that they make it easier to develop and apply… … Wikipedia
Abkürzungen/Computer — Dies ist eine Liste technischer Abkürzungen, die im IT Bereich verwendet werden. A [nach oben] AA Antialiasing AAA authentication, authorization and accounting, siehe Triple A System AAC Advanced Audio Coding AACS … Deutsch Wikipedia
Liste der Abkürzungen (Computer) — Dies ist eine Liste technischer Abkürzungen, die im IT Bereich verwendet werden. A [nach oben] AA Antialiasing AAA authentication, authorization and accounting, siehe Triple A System AAC Advanced Audio Coding AACS … Deutsch Wikipedia
Design for testing — Design for Test (aka Design for Testability or DFT ) is a name for design techniques that add certain testability features to a microelectronic hardware product design. The premise of the added features is that they make it easier to develop and… … Wikipedia
